We have used spin-echo small-angle neutron scattering (SESANS) to probe the hierarchy of structures present in polymer–carbon nanocomposites, with length scales spanning over three orders of magnitude, from 10 nm to 16 μm. The data processing and reduction show a unified approach across two SESANS instruments (TU Delft and Larmor at the ISIS neutron source) and yield consistent data that are able to be modelled using well-established hierarchical models in freely available software such as SasView. Using this approach, we are able to extend the measured length scales by over an order of magnitude compared to traditional scattering methods. This yields information about the structure in the bulk that is inaccessible with conventional scattering techniques (SANS/SAXS) and points to a way for interrogating and investigating polymer nanocomposites routinely across multiple length scales.@en

The impact of the additive 1,8-diiodooctane on the morphology of bulk-heterojunction solar cells based on the systems P3HT:PC₇₁BM, PTB7:PC₇₁BM and PTB7-Th:PC₇₁BM is studied using a combination of Small Angle Neutron Scattering (SANS) and Atomic Force Microscopy (AFM). The results clearly show that while in the P3HT:PC₇₁BM system, the additive DIO promotes a slight coarsening of the phase domains (type I additive), in the systems PTB7:PC₇₁BM and PTB7-Th:PC₇₁BM, DIO promotes a large decrease in the size of the phase domains (type II additive). SANS is demonstrated as being particularly useful at detecting the minor morphological changes observed in the P3HT:PC₇₁BM system, which can be hardly seen in AFM. This work illustrates how SANS complements AFM and both techniques when used together provide a deeper insight into the nanoscale structure in thin organic photovoltaic (OPV) device films.

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