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P Ren
Academic Work (1)
Journal article (1)
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Badwidth analysis of functional interconnects used as test access mechanism
Journal article (2010) -
A. Van Den Berg (author)
,
P Ren (author)
,
E Marinissen (author)
,
G. Gaydadjiev (author)
,
Georgi Gaydadjiev (author)
,
K.G.W. Goossens (author)