Badwidth analysis of functional interconnects used as test access mechanism

Journal article (2010)

Authors

A. Van Den Berg External organisation
P Ren External organisation
E Marinissen External organisation
G. Gaydadjiev Computer Engineering - EEMCS
K.G.W. Goossens Computer Engineering - EEMCS
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

2010

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering