Extraction of collector resistances for device characterization and compact models

A unified parameter extraction procedure for scalable bipolar transistor model Mextram

Efficient generation of reduced-order circuit and device models for wide frequency applications

A referenced geometry based configuration scalable Mextram model for bipolar transistors

A reference geometry based scaling approach for bipolar transistor model mextram

Verification of Mextram 504.6 in Verilog-A and C-code (SiMKit 2.1.1) implementation

A case study of ESD failures at random levels: analysis, explanation and solution

Parameters extraction of a scalable mextram model for high-speed SiGe HBTs

A new extraction technique for the series resistance of semiconductor devices based on the intrinsic properties of bias-dependent Y-parameters

Extended mextram model to wide frequency range

Mixed compact and behavior modeling using AHDL verilog-A