Dynamic faults in random-access-memories: concept, fault models and tests

Journal article (2003)

Authors

S. Hamdioui Computer Engineering - EEMCS
Z. Al-Ars Computer Engineering - EEMCS
AJ van de Goor Computer Engineering - EEMCS
M Rodgers External organisation
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

2003

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering