A probabilistic physics-of-failure reliability assessment approach for integrated LED lamps

Conference paper (2018)

Authors

B. Sun Guangdong University of Technology
Jiajie Fan Hohai University
Xue-Jun Fan Lamar University
GQ Zhang Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
Copyright: © 2018 B. Sun, J. Fan, Xuejun Fan, Kouchi Zhang
DOI: https://doi.org/10.1109/EuroSimE.2018.8369897
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Published Date

2018

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials

Abstract

This work studies the effect of randomness of LED's lumen depreciation on reliability of the entire LED lamp. An integrated LED light bulb is selected as carrier of the proposed method. A PoF based lumen depreciation model and electronic-thermal simulations are introduced for reliability prediction. The normal distribution is used to describe the statistical distribution of LEDs. The probabilities of the driver's catastrophic failures and lumen can then be obtained by Monte Carlo simulations by considering the increase of lamp's temperature. The effect of the lumen depreciation to the entire lamp is studied with two scenarios: constant light mode and constant current mode.

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