The effect of the detector resolution on the Doppler broadening measurements of both valence and core electron-positron annihilation

Ghosh, VJ; Nielsen, B; Kruseman, AC; Mijnarends, P.E.; van Veen, A; Lynn, KG

The effect of the detector resolution on the Doppler broadening measurements of both valence and core electron-positron annihilation

Journal article (1999)

Authors

VJ Ghosh External organisation

B Nielsen External organisation

AC Kruseman External organisation

P.E. Mijnarends Old - Section Defects in Materials

A van Veen Old - Section Defects in Materials

KG Lynn External organisation

Research Group

Old - Section Defects in Materials

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Published Date

1999

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Research Group

Old - Section Defects in Materials