On the origin of amplitude reduction mechanism in tapping mode atomic force microscopy

Keyvani Janbahan, A.; Sadeghian, Hamed; Goosen, J.F.L.; van Keulen, A.

doi:10.1063/1.5016306

On the origin of amplitude reduction mechanism in tapping mode atomic force microscopy

Journal article (2018)

Authors

A. Keyvani Janbahan TNO, Computational Design and Mechanics - Mechanical, Maritime and Materials Engineering

Hamed Sadeghian TNO, Eindhoven University of Technology

J.F.L. Goosen Computational Design and Mechanics - Mechanical, Maritime and Materials Engineering

A. van Keulen Computational Design and Mechanics - Mechanical, Maritime and Materials Engineering

Research Group

Computational Design and Mechanics (Mechanical, Maritime and Materials Engineering) (TU Delft)

DOI: https://doi.org/10.1063/1.5016306

Atomic force microscopy Nonlinear dynamics Continuum mechanics Fourier analysis Intermolecular forces Nanopatterning Newtonian mechanics

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Published Date

2018

Language

English

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Faculty

Mechanical, Maritime and Materials Engineering

Department

Precision and Microsystems Engineering

Research Group

Computational Design and Mechanics

Abstract

The origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typically attributed to the shift in resonance frequency of the cantilever due to the nonlinear tip-sample interactions. In this paper, we present a different insight into the same problem which, besides explaining the amplitude reduction mechanism, provides a simple reasoning for the relationship between tip-sample interactions and operation parameters (amplitude and frequency). The proposed formulation, which attributes the amplitude reduction to an interference between the tip-sample and dither force, only deals with the linear part of the system; however, it fully agrees with experimental results and numerical solutions of the full nonlinear model of TM-AFM.

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