In situ transmission electron microscopy imaging of grain growth in a platinum nanobridge induced by electric current annealing

Journal article (2011)

Authors

B Gao QN/Mol. Electronics & Devices
K.S. Mc Garrity Statistics - EEMCS
F. Prins QN/Mol. Electronics & Devices , QN/Fysics of NanoElectronics
J.M. Thijssen QN/Theoretical Physics
H.S.J. van der Zant QN/Mol. Electronics & Devices
Research Group
QN/Mol. Electronics & Devices
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Published Date

2011

Language

Undefined/Unknown

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Research Group

QN/Mol. Electronics & Devices