Cross section by focussed ion beam of in-situ induced phase transformed zones at grain boundaries in Cu3Au TEM foils

Mohdadi, H; Sivel, VGM; Tichelaar, F.D.; Zandbergen, H.W.

Cross section by focussed ion beam of in-situ induced phase transformed zones at grain boundaries in Cu3Au TEM foils

Poster (2003)

Authors

H Mohdadi QN/High Resolution Electron Microscopy

VGM Sivel OLD Virtual Materials and Mechanics

F.D. Tichelaar QN/High Resolution Electron Microscopy

H.W. Zandbergen QN/High Resolution Electron Microscopy

Research Group

QN/High Resolution Electron Microscopy

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Published Date

2003

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Research Group

QN/High Resolution Electron Microscopy