Pupil mask diversity for image correction in microscopy

Journal article (2018)

Authors

D. Wilding Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering
P. Pozzi Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering
O.A. Soloviev ITMO University, Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering , Flexible Optical B.V.
Gleb Vdovin ITMO University, Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering , Flexible Optical B.V.
M.H.G. Verhaegen Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering
Research Group
Team Raf Van de Plas (Mechanical, Maritime and Materials Engineering) (TU Delft)
Copyright: © 2018 D. Wilding, P. Pozzi, O.A. Soloviev, Gleb Vdovin, M.H.G. Verhaegen
DOI: https://doi.org/10.1364/OE.26.014832
More Info
expand_more

Published Date

2018

Language

English

Faculty

Mechanical, Maritime and Materials Engineering

Department

Delft Center for Systems and Control

Research Group

Team Raf Van de Plas

Abstract

Three-dimensional microscopy suffers from sample-induced aberrations that reduce the resolution and lead to misinterpretations of the object distribution. In this paper, the resolution of a three-dimensional fluorescent microscope is significantly improved by introducing an amplitude diversity in the form of a binary amplitude mask positioned in several di erent orientations within the pupil, followed by computer processing of the diversity images. The method has proved to be fast, easy to implement, and cost-e ective in high-resolution imaging of casper fli:GFP zebrafish.