Yield Estimation of a Memristive Sensor Array

Conference paper (2020)

Authors

V Gupta University of Rome Tor Vergata
Saurabh Khandelwal Oxford Brookes University
Giulio Panunzi University of Rome Tor Vergata
E Martinelli University of Rome Tor Vergata
Said Hamdioui Quantum & Computer Engineering
Abusaleh Jabir Oxford Brookes University
Marco Ottavi University of Rome Tor Vergata
Department
Quantum & Computer Engineering
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Published Date

2020

Language

English

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Department

Quantum & Computer Engineering

Abstract

This paper proposes a method to calculate the yield of a memristor based sensor array considered as the probability that the chip provides acceptable sensing results when the array is affected by manufacturing defects. The modeling is based on a Markov Chain approach, in which each state represents an operating chip configuration and the state transitions take into account manufacturing defects. The proposed method is applicable to evaluate the yield with different fault models to achieve the comparative yield obtained by several redundancy allocations.

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