Laser ablation threshold of YBa2Cu3O6+x

Journal article (1994)

Authors

B. Dam Vrije Universiteit Amsterdam
J. H. Rector Vrije Universiteit Amsterdam
M.F. Chang Vrije Universiteit Amsterdam
S. Kars Vrije Universiteit Amsterdam
D.G. De Groot Vrije Universiteit Amsterdam
Ronald Griessen Vrije Universiteit Amsterdam
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Published Date

1994

Language

English

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Abstract

Using projection optics we made a detailed study of the interaction of a spatially uniform 248 nm excimer laser beam and a 99% dense YBa 2Cu3O6+x target. Below a threshold fluence of 1 J/cm2 the roughness of the irradiated target increases dramatically due to non-stoichiometric ablation. The overall target surface composition becomes increasingly Y rich and Cu poor, while the opposite is found for the corresponding ablated thin films. Above the threshold fluence the composition of the ablated target surface is conserved. As a result of the energy homogeneity of the laser beam obtained by means of projection optics, the optimization of the deposition parameters has been improved leading to the reproducible fabrication of flat, stoichiometric YBa2Cu3O7 films with Tc0's over 91 K.