Simulating multiple diffraction in imaging systems using a path integration method

Journal article (2016)

Authors

B.M. Mout ImPhys/Optics - AS
Michael Wick Carl Zeiss
F. Bociort ImPhys/Optics - AS
Joerg Petschulat Carl Zeiss
Hendrik Paul Paul Urbach ImPhys/Optics - AS
Research Group
ImPhys/Optics (AS) (TU Delft)
Copyright: Campus only © 2016 B.M. Mout, Michael Wick, F. Bociort, Joerg Petschulat, Paul Urbach
DOI: https://doi.org/10.1364/AO.55.003847
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Published Date

10-05-2016

Language

English

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Faculty

Applied Sciences

Department

ImPhys/Imaging Physics

Research Group

ImPhys/Optics

Abstract

We present a method for simulating multiple diffraction in imaging systems based on the Huygens–Fresnel principle. The method accounts for the effects of both aberrations and diffraction and is entirely performed using Monte Carlo ray tracing.We compare the results of this method to those of reference simulations for field propagation through optical systems and for the calculation of point spread functions. The method can accurately model a wide variety of optical systems beyond the exit pupil approximation.

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