An experimental analysis of spot defects in SRAMs: realistic fault models and test

Conference paper (2000)

Authors

S. Hamdioui Computer Engineering - EEMCS
AJ van de Goor Ph D External organisation
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

2000

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering