Reliability of single-crystalline Si TFTs fabricated inside a location-controlled grain

Rana, V; Ishihara, R.; Metselaar, JW; Beenakker, C. W J; Hiroshima, Y; Abe, D; Inoue, S; Shimoda, T

Reliability of single-crystalline Si TFTs fabricated inside a location-controlled grain

Conference paper (2004)

Authors

V Rana Electronic Components, Technology and Materials

R. Ishihara Electronic Components, Technology and Materials

JW Metselaar Electronic Components, Technology and Materials

C. W J Beenakker Electronic Components, Technology and Materials

Y Hiroshima External organisation

D Abe External organisation

S Inoue External organisation

T Shimoda External organisation

Research Group

Electronic Components, Technology and Materials

Elektrotechniek Techniek

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Published Date

2004

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Research Group

Electronic Components, Technology and Materials