Correlation between hydroxyl fraction and O/Al atomic ratio as determined from XPS spectra of aluminum oxide layers

van den Brand, J; Sloof, W.G.; Terryn, H.A.; de Wit, J.H.W.

Correlation between hydroxyl fraction and O/Al atomic ratio as determined from XPS spectra of aluminum oxide layers

Journal article (2004)

Authors

J van den Brand OLD Surface and Interface Engineering

W.G. Sloof OLD Virtual Materials and Mechanics

H.A. Terryn OLD Surface and Interface Engineering

J.H.W. de Wit OLD Surface and Interface Engineering

Research Group

OLD Surface and Interface Engineering

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Published Date

2004

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Research Group

OLD Surface and Interface Engineering