Demonstration of PECVD SiC thermal delay lines for optical coherence tomography in the visible

Pandraud, G.; Margallo Balbas, E; Sarro, Pasqualina M

Demonstration of PECVD SiC thermal delay lines for optical coherence tomography in the visible

Journal article (2010)

Authors

G. Pandraud Electronic Components, Technology and Materials

E Margallo Balbas Electronic Instrumentation

Pasqualina M Sarro Electronic Components, Technology and Materials

Research Group

Electronic Components, Technology and Materials

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Published Date

2010

Language

English

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Research Group

Electronic Components, Technology and Materials