The relation between the defect structure, the surface roughness and the growth conditions of YBa2Cu3O7-δ films

Dam, Bernard; Træholt, Chresten; Stäuble-Pümpin, B; Rector, J. H.; De Groot, D.G.

The relation between the defect structure, the surface roughness and the growth conditions of YBa₂Cu₃O_7-δ films

Journal article (1997)

Authors

Bernard Dam Vrije Universiteit Amsterdam

Chresten Træholt

B Stäuble-Pümpin Vrije Universiteit Amsterdam

J. H. Rector Vrije Universiteit Amsterdam

D.G. De Groot Vrije Universiteit Amsterdam

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Surface roughness Defect structure Growth conditions YBaCuO Films

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Published Date

1997

Language

English

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Abstract

YBa₂Cu₃O_7-δ films on SrTiO₃ are characterized by a network of anti-phase boundaries (APB's), protruding from the interface to the film surface. We propose that the island morphology of these films is to a large extent determined by this network. At APB-outcrops deep trenches form which separate the growth islands. At the cross-section of three APB's deep holes are formed. It is found that the growth island size can be increased by increasing the substrate temperature or the oxygen pressure during growth.

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