Acid-base characterization of aluminum oxide surfaces with XPS

van den Brand, J; Snijders, PC; Sloof, W.G.; Terryn, H.A.; de Wit, J.H.W.

Acid-base characterization of aluminum oxide surfaces with XPS

Journal article (2004)

Authors

J van den Brand OLD Surface and Interface Engineering

PC Snijders QN/Fysics of NanoElectronics

W.G. Sloof OLD Virtual Materials and Mechanics

H.A. Terryn OLD Surface and Interface Engineering

J.H.W. de Wit OLD Surface and Interface Engineering

Research Group

OLD Surface and Interface Engineering

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Published Date

2004

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Research Group

OLD Surface and Interface Engineering