Angular resolved scattering measurements of nano-textured substrates in a broad wavelength range

Journal article (2011)

Authors

K. Jager Photovoltaic Materials and Devices
Olindo Isabella Photovoltaic Materials and Devices
RACMM van Swaaij Photovoltaic Materials and Devices
M Zeman Photovoltaic Materials and Devices
Research Group
Photovoltaic Materials and Devices
More Info
expand_more

Published Date

2011

Language

English

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

Photovoltaic Materials and Devices

Abstract

The angular intensity distribution (AID) is a major parameter for evaluating scattering of light by surface-textured thin films. We discuss how the AID can be determined in the near ultraviolet, the visible and the near infrared and evaluate the used method by comparing the obtained measurement results to the results obtained with other methods. Measuring the AID in a broad wavelength range is of great use for the solar cell community, because textured thin films are widely used to enhance the photocurrent in thin-film solar cells.

No files available

Metadata only record. There are no files for this journal article.