Characterization of microbial attachment on metal surfaces by Scanning Kelvin Probe and Epifluorescence Microscopy

Conference paper (2010)

Authors

A. Heyer OLD Surface and Interface Engineering
FD Souza External organisation
GM Ferrari External organisation
J.M.C. Mol OLD Surface and Interface Engineering
JHW de Wit OLD Surface and Interface Engineering
Research Group
OLD Surface and Interface Engineering
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Published Date

2010

Language

Undefined/Unknown

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Research Group

OLD Surface and Interface Engineering

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