Characterization of microbial attachment on metal surfaces by Scanning Kelvin Probe and Epifluorescence Microscopy

Heyer, A.; Souza, FD; Ferrari, GM; Mol, J.M.C.; de Wit, J.H.W.

Characterization of microbial attachment on metal surfaces by Scanning Kelvin Probe and Epifluorescence Microscopy

Conference paper (2010)

Authors

A. Heyer OLD Surface and Interface Engineering

FD Souza External organisation

GM Ferrari External organisation

J.M.C. Mol OLD Surface and Interface Engineering

J.H.W. de Wit OLD Surface and Interface Engineering

Research Group

OLD Surface and Interface Engineering

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Published Date

2010

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Research Group

OLD Surface and Interface Engineering