Quantitative dilatometric analysis of intercritical annealing in a low-silicon TRIP steel

Zhao, L; Kop, TA; Rolin, V; Sietsma, Jilt; Mertens, AIM; Jacques, PJ; Van der ZWAAG, S.

Quantitative dilatometric analysis of intercritical annealing in a low-silicon TRIP steel

Journal article (2002)

Authors

L Zhao OLD Metals Processing, Microstructures and Properties

TA Kop OLD Metals Processing, Microstructures and Properties

V Rolin OLD Metals Processing, Microstructures and Properties

Jilt Sietsma OLD Metals Processing, Microstructures and Properties

AIM Mertens OLD Metals Processing, Microstructures and Properties

PJ Jacques External organisation

S. Van der ZWAAG OLD Metals Processing, Microstructures and Properties

Research Group

OLD Metals Processing, Microstructures and Properties

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Published Date

2002

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Research Group

OLD Metals Processing, Microstructures and Properties

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