Generation-Recombination Noise: The Fundamental Sensitivity Limit for Kinetic Inductance Detectors

de Visser, P.J.; Baselmans, JJA; Diener, P; Endo, A.; Klapwijk, T.M.

Generation-Recombination Noise: The Fundamental Sensitivity Limit for Kinetic Inductance Detectors

Journal article (2012)

Authors

P.J. de Visser QN/Fysics of NanoElectronics

JJA Baselmans External organisation

P Diener External organisation

A. Endo QN/Fysics of NanoElectronics

T.M. Klapwijk QN/Fysics of NanoElectronics

Research Group

QN/Fysics of NanoElectronics

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Published Date

2012

Language

English

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Research Group

QN/Fysics of NanoElectronics