Thin ¿lm SOI HBT: A study of the effect of substrate bias on the electrical characteristics

Journal article (2006)

Authors

S Fregonese Old - EWI Ch. Integrated Sensing Devices
G Avenier External organisation
C Maneux External organisation
A Chantre External organisation
T Zimmer External organisation
Research Group
Old - EWI Ch. Integrated Sensing Devices
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Published Date

2006

Language

Undefined/Unknown

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Research Group

Old - EWI Ch. Integrated Sensing Devices

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