Test generation and optimization for DRAM cell defects using electrical simulation

Journal article (2003)

Authors

Z. Al-Ars Computer Engineering - EEMCS
AJ van de Goor Computer Engineering - EEMCS
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

2003

Language

Undefined/Unknown

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering