Chemical composition of thin oxide films on aluminium studied with infrared and visible spectroscopic ellipsometry.

Conference paper (2004)

Authors

S van Gils External organisation
J van den Brand OLD Surface and Interface Engineering
CA Melendres External organisation
H Terryn OLD Surface and Interface Engineering
E Stijns External organisation
Research Group
OLD Surface and Interface Engineering
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Published Date

2004

Language

Undefined/Unknown

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Research Group

OLD Surface and Interface Engineering

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