Gate oxide induced switch-on undershoot current observed in thin-film transistors

Yan, F; Migliorato, P; Hong, Y.; Rana, V; Ishihara, R; Hiroshima, Y; Abe, D; Inoue, S; Shimoda, T

Gate oxide induced switch-on undershoot current observed in thin-film transistors

Journal article (2005)

Authors

F Yan External organisation

P Migliorato External organisation

Y. Hong External organisation

V Rana Electronic Components, Technology and Materials

R Ishihara Electronic Components, Technology and Materials

Y Hiroshima External organisation

D Abe External organisation

S Inoue External organisation

T Shimoda External organisation

Research Group

Electronic Components, Technology and Materials

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Published Date

2005

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Research Group

Electronic Components, Technology and Materials

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