Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process

Conference paper (2011)

Authors

C. Veerappan Signal Processing Systems
J Richardson External organisation
R Walker External organisation
DU Li External organisation
M.W. Fishburn Signal Processing Systems
D Stoppa External organisation
F Borgetti External organisation
Y.. Maruyama Signal Processing Systems
MA Gersbach Microelectronics
RK Henderson External organisation
Claudio Bruschini External organisation
Edoardo Charbon-Iwasaki-Charbon Signal Processing Systems
Research Group
Signal Processing Systems
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Published Date

2011

Language

English

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Research Group

Signal Processing Systems

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