Defect oriented testing of the strap problem under process variations in DRAMs

Conference paper (2008)

Authors

Z. Al-Ars Computer Engineering - EEMCS
S. Hamdioui Computer Engineering - EEMCS
AJ van de Goor Computer Engineering - EEMCS
G Mueller External organisation
Research Group
Computer Engineering (EEMCS) (TU Delft)
More Info
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Published Date

2008

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering