X-Ray Micro Tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles

Perfetti, G.; Casteele, E; Rieger, B.; wildeboer, w.j.; Meesters, GMH

X-Ray Micro Tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles

Journal article (2010)

Authors

G. Perfetti OLD ChemE/NanoStructured Materials

E Casteele External organisation

B. Rieger ImPhys/Quantitative Imaging

w.j. wildeboer External organisation

GMH Meesters OLD ChemE/NanoStructured Materials

Research Group

OLD ChemE/NanoStructured Materials

To reference this document use:

http://resolver.tudelft.nl/uuid:414f2b52-b690-4543-a990-5faa90c75a17

More Info

expand_more

Published Date

2010

Language

English

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

OLD ChemE/NanoStructured Materials