X-Ray Micro Tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles

Perfetti, G.; Casteele, E; Rieger, B.; wildeboer, w.j.; Meesters, GMH

X-Ray Micro Tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles

Journal article (2010)

Authors

G. Perfetti OLD ChemE/NanoStructured Materials

E Casteele External organisation

B. Rieger ImPhys/Quantitative Imaging

w.j. wildeboer External organisation

GMH Meesters OLD ChemE/NanoStructured Materials

Research Group

OLD ChemE/NanoStructured Materials

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Published Date

2010

Language

English

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Research Group

OLD ChemE/NanoStructured Materials

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