Ion-implantation generated nanovoids in Si and MgO monitored by high resolution positron beam analysis

Conference paper (2001)

Authors

S.W.H. Eijt Old - Section Defects in Materials
CV Falub Old - Section Defects in Materials
A van Veen Old - Section Defects in Materials
P.E. Mijnarends Old - Section Defects in Materials
MA van Huis Old - Interfaculty Reactor Institute
AV Fedorov Old - Section Defects in Materials
Research Group
Old - Section Defects in Materials
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Published Date

2001

Language

Undefined/Unknown

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Research Group

Old - Section Defects in Materials