Atomic-scale electron microscopy at ambient pressure

Journal article (2008)

Authors

J.F. Creemer Old - EWI Sect. ECTM
S Helveg External organisation
GH Hoveling External organisation
S Ullmaan External organisation
AM Molenbroek External organisation
Pasqualina Sarro Electronic Components, Technology and Materials - EEMCS
Research Group
Old - EWI Sect. ECTM
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Published Date

2008

Language

Undefined/Unknown

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Research Group

Old - EWI Sect. ECTM