Structural characterization and porosity analysis in self-supported porous alumina-silica thin films

Tran, THY; Schut, H.; Haije, W.G.; Schoonman, Joop

Structural characterization and porosity analysis in self-supported porous alumina-silica thin films

Journal article (2011)

Authors

THY Tran ChemE/Materials for Energy Conversion and Storage

H. Schut RST/Neutron and Positron Methods in Materials

W.G. Haije ChemE/Materials for Energy Conversion and Storage

Joop Schoonman ChemE/Materials for Energy Conversion and Storage

Research Group

ChemE/Materials for Energy Conversion and Storage

To reference this document use:

http://resolver.tudelft.nl/uuid:24110f16-a9fb-4908-a526-d8a5bf86df7a

More Info

expand_more

Published Date

2011

Language

English

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

ChemE/Materials for Energy Conversion and Storage

No files available

Metadata only record. There are no files for this journal article.