Effects of self-limiting oxide layer on optical and electronic properties of WTe2 for optoelectronic applications

Abstract

The study focuses on the optical and electrical properties of Tungsten Ditelluride (WTe2), a type II Weyl semimetal, as well as the influence of its self-limiting oxide (SLO) layer that forms during natural oxidation. WTe2 exhibits promising applications in photodetection and energy harvesting due to its unique gapless linear dispersion and Berry-field-enhanced nonlinear optical effects. However, surface oxidation poses a challenge as it degrades the performance of WTe2. By employing spectroscopic ellipsometry and Raman spectroscopy, the progression of the oxide layer’s thickness and its impact on the optical constants of WTe2 were examined. The results revealed a rapid increase in oxide thickness within the first 24 h, and it reached saturation at ∼10 nm after 45 h of atmospheric exposure. Electrical properties were explored using Kelvin Probe Force Microscopy, uncovering a modification in surface potential and Fermi level following oxidation. Additionally, a SLO/WTe2 heterojunction device exhibited a wide region of positive and negative coexisting photocurrent, highlighting the potential for logical operations in ambient air. Finally, the mechanism of operation of the device is discussed. The electrical and optical properties of the pristine, partially oxidized and fully oxidized WTe2 are analyzed using density functional theory calculations. It shows that the SLO layer has a significant effect on the optical and electronic properties, which is instructive for future wavelength-modulated device optoelectronic logic operations.