Residual and bending stress measurements by X-ray diffraction and synchrotron diffraction analysis in silicon solar cells

Popovich, V.; van der Pers, NM; Janssen, M.; Bennett, IJ; Jansen, K.M.B.; Wright, J; Richardson, I.M.

Residual and bending stress measurements by X-ray diffraction and synchrotron diffraction analysis in silicon solar cells

Conference paper (2012)

Authors

V. Popovich OLD Metals Processing, Microstructures and Properties

NM van der Pers External organisation

M. Janssen OLD Metals Processing, Microstructures and Properties

IJ Bennett External organisation

K.M.B. Jansen OLD Product Engineering

J Wright External organisation

I.M. Richardson OLD Metals Processing, Microstructures and Properties

Research Group

OLD Metals Processing, Microstructures and Properties

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Published Date

2012

Language

English

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Research Group

OLD Metals Processing, Microstructures and Properties