Quality of Heusler single crystals examined by depth-dependent positron annihilation techniques

Hugenschmidt, C; Bauer, A; Schut, H.; Weber, J.; Boni, P.; Ceeh, H.; Eijt, S.W.H.; Gigl, T; Pfleiderer, C.; Piochacz, C.; Neubauer, A.; Reiner, M.

Quality of Heusler single crystals examined by depth-dependent positron annihilation techniques

Journal article (2015)

Authors

C Hugenschmidt External organisation

A Bauer External organisation

H. Schut RST/Neutron and Positron Methods in Materials -

J. Weber External organisation

P. Boni External organisation

H. Ceeh External organisation

S.W.H. Eijt RST/Fundamental Aspects of Materials and Energy -

T Gigl External organisation

C. Pfleiderer External organisation

C. Piochacz External organisation

A. Neubauer External organisation

M. Reiner External organisation

Research Group

RST/Fundamental Aspects of Materials and Energy () (TU Delft)

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Published Date

2015

Language

English

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Faculty

Applied Sciences

Department

RST/Radiation, Science and Technology

Research Group

RST/Fundamental Aspects of Materials and Energy