Medium characterization from interface-wave impedance and ellipticity using simultaneous displacement and pressure measurements

van Dalen, K.N.; Drijkoningen, G.G.; Smeulders, D.M.J.; Heller, HKJ; Glorieux, C; Sarens, B; Verstraeten, B

Medium characterization from interface-wave impedance and ellipticity using simultaneous displacement and pressure measurements

Journal article (2011)

Authors

K.N. van Dalen Applied Geophysics and Petrophysics -

G.G. Drijkoningen Applied Geophysics and Petrophysics -

D.M.J. Smeulders Applied Geophysics and Petrophysics -

HKJ Heller External organisation

C Glorieux External organisation

B Sarens External organisation

B Verstraeten External organisation

Research Group

Applied Geophysics and Petrophysics () (TU Delft)

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Published Date

2011

Language

English

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Faculty

Civil Engineering & Geosciences

Department

Geoscience and Engineering

Research Group

Applied Geophysics and Petrophysics