Angular resolved scattering by a nano-textured ZnO/silicon interface

Journal article (2011)

Authors

M Schulte External organisation
K Bittkau External organisation
K. Jager Photovoltaic Materials and Devices - EEMCS
AM Ermes External organisation
M. Zeman Photovoltaic Materials and Devices - EEMCS
BE Pieters External organisation
Research Group
Photovoltaic Materials and Devices (EEMCS) (TU Delft)
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Published Date

2011

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Electrical Sustainable Energy

Research Group

Photovoltaic Materials and Devices

Abstract

Textured interfaces in thin-film silicon solar cells improve the efficiency by light scattering. A technique to get experimental access to the angular intensity distribution (AID) at textured interfaces of the transparent conductive oxide (TCO) and silicon is introduced. Measurements are performed on a sample with polished microcrystalline silicon layer deposited onto a rough TCO layer. The AID determined from the experiment is used to validate the AID obtained by a rigorous solution of Maxwell¿s equations. Furthermore, the applicability of other theoretical approaches based on scalar scattering theory and ray tracing is discussed with respect to the solution of Maxwell¿s equations.