Library
search
Press enter to search in title/abstract
in title/abstract
in authors
local_library
Repository
SL
SR Lokhorst
Academic Work (1)
Conference paper (1)
Sort by descending (newest to oldest)
Sort by ascending (oldest to newest)
1 records found
1
The effect of sidewall roughness on line edge roughness in top-down scanning electron microscopy images
Conference paper (2015) -
T. Verduin (author)
,
SR Lokhorst (author)
,
P. Kruit (author)
,
C.W. Hagen (author)
