MN
M.R. Nabavi
18 records found
1
Displacement sensing with sub-nanometer resolution is required in advanced metrology and high-tech industry, e.g., to measure the lens position in wafer scanners. Linear encoders and interferometers are often used for this purpose, but they are bulky and costly. Capacitive sensor
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This paper presents a comprehensive study of demodulation techniques for high-frequency self-oscillating eddy-current displacement sensor (ECDS) interfaces. Increasing the excitation frequency is essential for lowering the skin depth in many demanding industrial applications, tha
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