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RH Bergmans
Academic Work (1)
Journal article (1)
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Towards interferometry for dimensional drift measurements with nanometer uncertainty
Journal article (2011) -
D Voigt (author)
,
J.D. Ellis (author)
,
AL Verlaan (author)
,
RH Bergmans (author)
,
J.W. Spronck (author)
,
R.H. Munnig Schmidt (author)
