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RF-noise modeling in MOSFETs: Excess noise, symmetry, and causality
Conference paper (2014) -
GDJ Smit (author)
,
AJ Scholten (author)
,
RMT Pijper (author)
,
LF Tiemeijer (author)
,
R. van der Toorn (author)
,
D.B.M. Klaassen (author)
,
P Scheer (author)
,
A Juge (author)
