A new methodology for Total Ionizing Dose (TID) tests is proposed. It is based on the employment of an on-chip 90 Sr/ 90 Y beta source as alternative to standard methods such as 60 Co gamma rays and electrons from LINAC. The use of a compact beta source for TID tests has several advantages. In particular, the irradiation of devices with more than one radiation source results in a better representation of the complex space radiation environment composed of several types, energies and dose-rates. In addition, the use of an easy handling beta source allows the irradiation of electronic devices without any damage to other auxiliary circuit. In this work, 90 Sr/ 90 Y beta source dosimetry and related radiation field characteristics are discussed in depth. In order to validate the proposed source for TID tests, a rather complex device such as the “SPC56EL70L5” microcontroller from ST-Microelectronics was exposed to 90 Sr/ 90 Y beta rays. The results of this test were compared to that of a previous test of another sample from the same lot with a standard gamma 60 Co source. The electronic performances following the two irradiations have been found to be in excellent agreement, by demonstrating therefore the validity of the proposed beta source for TID tests.
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