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AB
A Beyer
2 records found
1
Authored
Focused electron beam induced processing and the effect of substrate thickness revisited
Journal article (2013) -
W.F. van Dorp
,
A Beyer
,
M Mainka
,
A Gölzhäuser
,
TW Hansen
,
JB Wagner
,
C.W. Hagen
,
JTM de Hosson
Ultrahigh resolution focused electron beam induces processing: the effect of substrate thickness
Journal article (2011) -
W.F. van Dorp
,
I. Lazic
,
A Beyer
,
A Golzhauser
,
JB Wagner
,
TW Hansen
,
C.W. Hagen
