This paper introduces SIMPLY+, an advanced Spin-Transfer Torque Magnetic Random-Access Memory (STT-MRAM)-based Logic-in-Memory (LIM) architecture that evolves from the previously proposed smart material implication (SIMPLY) logic scheme. More specifically, the latter is enhanced by incorporating additional circuitry to enhance the reliability of preliminary read operations. In this study, the proposed architecture is benchmarked against its conventional counterpart. Obtained results show a significant improvement in terms of reliability, i.e., the nominal read margin (RM) by a factor of ~3 - 4× and accordingly the bit error rate (BER) by more than four orders of magnitude. These improvements come at minimal cost in terms of circuit area and complexity compared to the conventional SIMPLY design. Overall, this research establishes SIMPLY+ as a promising solution for the design of reliable and energy-efficient in-memory computing architectures.

This brief deals with the impact of spin-transfer torque magnetic random access memory (STT-MRAM) cell based on double-barrier magnetic tunnel junction (DMTJ) on the performance of a two-layer multilayer perceptron (MLP) neural network. The DMTJ-based cell is benchmarked against the conventional single-barrier MTJ (SMTJ) counterpart by means of a comprehensive evaluation carried out through a state-of-the-art device-to-algorithm simulation framework. The benchmark is based on the MNIST handwritten dataset, Verilog-A MTJ compact models developed by our group, and 0.8 V FinFET technology. Our results point out that the use of DMTJ-based STT-MRAM cells to implement digital embedded non-volatile memory (eNVM) synaptic core allows write/read energy and latency improvements of about 53%/61% and 66%/17%, respectively, as compared to the SMTJ-based equivalent design. This is achieved by ensuring a reduced area footprint and a learning accuracy of about 91%. Such results make the DMTJ-based STT-MRAM cell a good eNVM option for neuro-inspired computing.