Environmentally friendly humidity sensors with high sensing performance are considered crucial components for various wearable electronic devices. We developed a rapid-response and durable Paper Cellulose Fiber/Graphene Oxide Matrix (PCFGOM) humidity sensor using an all-carbon functional material. The fabricated sensor demonstrated a high sensitivity to humidity through an electrical impedance measurement, with an increase in response to humidity ranging from 10% to 90% at 1 kHz and 10 kHz, respectively, along with a response time of 1.2 s and a recovery time of 0.8 s. The stability of the sensor was also examined, with consistent performance over a period of 24 h. This novel sensor was employed in several applications, including non-contact proximity sensing, environmental humidity detection, and human respiration detection, to showcase its potential. Moreover, this work represents a significant milestone in developing inexpensive and eco-friendly humidity sensors, given the abundance of paper and graphene in nature and their biocompatibility.

Recently, phase change chalcogenides, such as monochalcogenides, are reported as switching materials for conduction-bridge-based memristors. However, the switching mechanism focused on the formation and rupture of an Ag filament during the SET and RESET, neglecting the contributions of the phase change phenomenon and the distribution and re-distribution of germanium vacancies defects. The different thicknesses of germanium telluride (GeTe)-based Ag/GeTe/Pt devices are investigated and the effectiveness of phase loops and defect loops future application in neuromorphic computing are explored. GeTe-based devices with thicknesses of 70, 100, and 200 nm, are fabricated and their electrical characteristics are investigated. Highly reproducible phase change and defect-based characteristics for a 100 nm-thick GeTe device are obtained. However, 70 and 200 nm-thick devices are unfavorable for the reliable memory characteristics. Upon further analysis of the Ag/GeTe/Pt device with 100 nm of GeTe, it is discovered that a state-of-the-art dependency of phase loops and defect loops exists on the starting and stopping voltage sweeps applied on the top Ag electrode. These findings allow for a deeper understanding of the switching mechanism of monochalcogenide-based conduction-bridge memristors.