Degradation of CMOS image sensors in deep-submicron technology due to gamma-radiation

Journal article (2008)

Authors

Rao padmakumar External organisation
X Wang Electronic Instrumentation
A.J.P.A.M. Theuwissen Electronic Instrumentation
Research Group
Electronic Instrumentation
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Published Date

2008

Language

Undefined/Unknown

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Research Group

Electronic Instrumentation

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