Degradation of spectral response and dark current of CMOS image sensor in deep-submicron technology due to gamma-irradiation

Conference paper (2007)

Authors

Rao padmakumar External organisation
X Wang Electronic Instrumentation - EEMCS
A.J.P.A.M. Theuwissen Electronic Instrumentation - EEMCS
Research Group
Electronic Instrumentation (EEMCS) (TU Delft)
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Published Date

2007

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Instrumentation