Time-frequency analysis of lifted and standard iterative learning control applied to the short stroke of a wafer stage test rig

Report (2002)

Authors

I Rotariu External organisation
BG Dijkstra DISC - Mechanical, Maritime and Materials Engineering
R Ellenbroek External organisation
M Steinbuch External organisation
Research Group
DISC (Mechanical, Maritime and Materials Engineering) (TU Delft)
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Published Date

2002

Language

Undefined/Unknown

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Faculty

Mechanical, Maritime and Materials Engineering

Department

Delft Center for Systems and Control

Research Group

DISC