Time-frequency analysis of lifted and standard iterative learning control applied to the short stroke of a wafer stage test rig

Report (2002)

Authors

I Rotariu External organisation
R Ellenbroek External organisation
M Steinbuch External organisation
Research Group
DISC
More Info
expand_more

Published Date

2002

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

DISC

No files available

Metadata only record. There are no files for this report.